|
View
| Atom Probe Tomography_EiKOS UV | Other processes | Alexander Dahlström | Tao Zhou | Cameca | EIKOS-UV |
|
View
| Atomic Force Microscope - Dimension 3100 | Surface analysis & TEM | Liubov Belova | Valter Ström | VEECO | Dimension 3100 |
|
View
| CUT_Accutom5 | Sample prep | Tao Zhou | | Struers | Accutom 5 |
|
View
| CUT_Isomet5000 | Sample prep | Tao Zhou | | Buehler | Isomet 5000 |
|
View
| CUT_Laser | Sample prep | Mohammad Mehdi Hoseini Athar | | ZACLaser | ZAC3030 |
|
View
| Discatom-2 cutting | Sawing | Tao Zhou | Mohammad Mehdi Hoseini Athar | Struers | Discatom-2 |
|
View
| Duramin-40 Microhardness Tester | Nanoindentation | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Struers | Duramin-40 |
|
View
| FIB_Nova600 | Surface analysis & TEM | Sonia Guehairia | Mohammad Mehdi Hoseini Athar | FEI (Thermo Fisher Scientific) | Nova 600 |
|
View
| High temperature isothermal dilatometer | Thermal processes | Peter Hedström | Surbhi Shivaji Jogdand | NETZSCH | DIL 402 SUPREME Expedis |
|
View
| High-temperature confocal laser scanning microscopy | Thermal processes | Peter Hedström | | Yonekura | VL2000DX-SVF17SP |
|
View
| Ion Beam Polisher | Sample prep | Tao Zhou | Kaiyang Zeng | JOEL | JOEL IB-19520CCP |
|
View
| LectroPol-5 (Bulk sample) | Sample prep | Tao Zhou | | Struers | LectroPol 5 |
|
View
| LOM_Leica DM 750 M | Surface analysis & TEM | Tao Zhou | | Leica | DM 750 M |
|
View
| LOM_Leica DMRM | Surface analysis & TEM | Tao Zhou | | Leica | DMRM |
|
View
| LOM_Olympus BX53M | Surface analysis & TEM | Tao Zhou | Kaiyang Zeng | Olympus | BX53M |
|
View
| LOM_Olympus PMG 3 | Surface analysis & TEM | Tao Zhou | | Olympus | PMG 3 |
|
View
| Mass Spectrometer | Thermal processes | Peter Hedström | | NETZSCH | QMS 403 D Aeolos |
|
View
| Mount_Simplimet_2000 | Sample prep | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Buehler | Simplimet 2000 |
|
View
| MXT-a1 Microhardness Tester | Surface analysis & TEM | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Matsuzawa | MXT-a1 |
|
View
| Nano In-situ SEM Device FT-NMT04 | Nanoindentation | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Femto Tools | FT-NMT04 |
|
View
| Nanoindenter-FTI04 | Nanoindentation | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Femto Tools | FT-I04 |
|
View
| PIPS_Gatan691 | Sample prep | Peter Hedström | | Gatan | 691 |
|
View
| Polish_Phoenix4000 | Sample prep | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Buehler | Phoenix 4000 |
|
View
| Quench-Deformation Dilatometer | Thermal processes | Peter Hedström | Tao Zhou | Linseis | L78 RITA |
|
View
| Retsch planetary ball mill | Other processes | Arun Kamalasekaran | Samina Gulshan | Retsch | PM100 |
|
View
| Rolling Mill (Hot/Cold) | Other processes | Mohammad Mehdi Hoseini Athar | | Durston | FSM160 |
|
View
| SEM_HitachiS3700N | Surface analysis & TEM | Peter Hedström | Tao Zhou | Hitachi | S-3700N |
|
View
| SEM_JEOL7800F | Surface analysis & TEM | Peter Hedström | Tao Zhou | JEOL | 7800F |
|
View
| Simultaneous Thermal Analyzer | Thermal processes | Peter Hedström | Surbhi Shivaji Jogdand | NETZSCH | 449 F1 Jupiter |
|
View
| Sputter coat_CC7650 | Sample prep | Tao Zhou | | Polaron (Quorum) | CC7650 |
|
View
| Sputter coat_Gold | Sample prep | Tao Zhou | | JEOL | JFC 1300 |
|
View
| TEM Support | Surface analysis & TEM | Tao Zhou | | FEI-TF/JEOL | Titan Themis/2100F |
|
View
| TenuPol-5 (Thin foil) | Surface analysis & TEM | Tao Zhou | | Struers | TenuPol-5 |
|
View
| Universal Testing Machine 10kN | Other processes | Mohammad Mehdi Hoseini Athar | | Shimadzu | AGX-V2 |
|
View
| Vibrating Sample Magnetometer | Magnetometry | Valter Ström | | Princeton Applied Research | 155 |
|
View
| XRD_BrukerD8Discover | Surface analysis & TEM | Peter Hedström | Gabriel Spartacus | Bruker | D8 Discover |
|
View
| XRD_SIEMENSD5000 | Surface analysis & TEM | Peter Hedström | Valter Ström | SIEMENS | D5000 |