The JEOL JSM-7800F is a high-resolution FEG-SEM that allows for imaging with a spatial resolution down to 0.8 nm at 15 kV and 1.2 nm at 1 kV. With a very low incident electron energy, fine surface structures are revealed. A large probe current allows you to analyze samples quickly without sacrificing the precision and quality of the analyses. The instrument is equipped with a retractable backscattered detector for short-range BSE imaging and in-lens SE and BSE detector. It is further equipped with Bruker analytical systems EDS and EBSD for chemical and crystallographic analysis, respectively. The microscope's super hybrid lens is a field free lens at the analytical working distance. Magnetic samples can be observed and analyzed at high magnifications. Non-conductive samples are easily observed at low voltages with high resolution.