Atom probe tomography (APT) is a unique and powerful atom-by-atom 3D imaging technique with sub-nm spatial resolution. Equal detection efficiency of nearly all elements enables analysis of nanoscale features such as precipitates, grain boundaries, defects, and clusters.
The EIKOS-UV instrument is a workhorse APT equipped with a UV-laser which widens the application range including metals, coatings, thin films, ceramics, minerals, functional materials.
Technical information
- Flight path type: Large Angle Reflectron.
- Detection efficiency: 36%.
- Minimum specimen temperature (K): 40.
- Voltage Pulse Amplitude (max.): 2000V.
- Voltage Pulse Repetition Rate (max.): 100 kHz.
- Laser Pulse Repetition Rate (max.): 200 kHz.
- Laser wavelength: 355 nm.
- Laser Spot size (diameter): ≤ 5 micron.
- Minimum detection rate (DR, %): 0.10%.
- Software: APSuite.
The instrument uses an integrated local electrode (ILE) design. This means only wire geometry samples are accepted, samples and ILE are mounted to the specimen puck ex-situ.
Auxiliary equipment includes an electropolishing micro-loop for production of specimen from a wide variety of materials and advanced accessories for FIB-based specimen preparation.