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| Atom Probe Tomography_EiKOS UV | Other processes | Alexander Dahlström | Tao Zhou | Cameca | EIKOS-UV |
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| Atomic Force Microscope - Dimension 3100 | Surface analysis & TEM | Liubov Belova | Valter Ström | VEECO | Dimension 3100 |
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| CUT_Accutom5 | Sample prep | Tao Zhou | | Struers | Accutom 5 |
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| CUT_Isomet5000 | Sample prep | Tao Zhou | | Buehler | Isomet 5000 |
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| Discatom-2 cutting | Sawing | Arun Kamalasekaran | Samina Gulshan | Struers | Discatom-2 |
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| Duramin-40 Microhardness Tester | Nanoindentation | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Struers | Duramin-40 |
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| FIB_Nova600 | Surface analysis & TEM | Sonia Guehairia | Mohammad Mehdi Hoseini Athar | FEI (Thermo Fisher Scientific) | Nova 600 |
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| High temperature isothermal dilatometer | Thermal processes | Peter Hedström | Surbhi Shivaji Jogdand | NETZSCH | DIL 402 SUPREME Expedis |
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| High-temperature confocal laser scanning microscopy | Thermal processes | Bharat Mehta | | Yonekura | VL2000DX-SVF17SP |
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| Ion Beam Polisher | Sample prep | Tao Zhou | Sonia Guehairia | JOEL | JOEL IB-19520CCP |
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| LectroPol-5 (Bulk sample) | Sample prep | Tao Zhou | | Struers | LectroPol 5 |
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| LOM_Leica DM 750 M | Surface analysis & TEM | Tao Zhou | | Leica | DM 750 M |
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| LOM_Leica DMRM | Surface analysis & TEM | Tao Zhou | | Leica | DMRM |
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| LOM_Olympus BX53M | Surface analysis & TEM | Tao Zhou | | Olympus | BX53M |
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| LOM_Olympus PMG 3 | Surface analysis & TEM | Tao Zhou | | Olympus | PMG 3 |
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| Mass Spectrometer | Thermal processes | Peter Hedström | | NETZSCH | QMS 403 D Aeolos |
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| Mount_Simplimet_2000 | Sample prep | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Buehler | Simplimet 2000 |
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| MXT-a1 Microhardness Tester | Surface analysis & TEM | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Matsuzawa | MXT-a1 |
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| Nano In-situ SEM Device FT-NMT04 | Nanoindentation | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Femto Tools | FT-NMT04 |
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| Nanoindenter-FTI04 | Nanoindentation | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Femto Tools | FT-I04 |
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| PIPS_Gatan691 | Sample prep | Peter Hedström | | Gatan | 691 |
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| Polish_Phoenix4000 | Sample prep | Mohammad Mehdi Hoseini Athar | Nader Heshmati | Buehler | Phoenix 4000 |
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| Quench-Deformation Dilatometer | Thermal processes | Peter Hedström | Tao Zhou | Linseis | L78 RITA |
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| Retsch planetary ball mill | Other processes | Arun Kamalasekaran | Samina Gulshan | Retsch | PM100 |
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| SEM_HitachiS3700N | Surface analysis & TEM | Peter Hedström | Tao Zhou | Hitachi | S-3700N |
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| SEM_JEOL7800F | Surface analysis & TEM | Peter Hedström | Tao Zhou | JEOL | 7800F |
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| Simultaneous Thermal Analyzer | Thermal processes | Peter Hedström | Surbhi Shivaji Jogdand | NETZSCH | 449 F1 Jupiter |
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| Sputter coat_CC7650 | Sample prep | Gabriel Spartacus | | Polaron (Quorum) | CC7650 |
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| Sputter coat_Gold | Sample prep | Tao Zhou | | JEOL | JFC 1300 |
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| TEM Support | Surface analysis & TEM | Tao Zhou | | FEI-TF/JEOL | Titan Themis/2100F |
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| TenuPol-5 (Thin foil) | Surface analysis & TEM | Tao Zhou | | Struers | TenuPol-5 |
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| Vibrating Sample Magnetometer | Magnetometry | Valter Ström | | Princeton Applied Research | 155 |
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| XRD_BrukerD8Discover | Surface analysis & TEM | Peter Hedström | Gabriel Spartacus | Bruker | D8 Discover |
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| XRD_SIEMENSD5000 | Surface analysis & TEM | Peter Hedström | Gabriel Spartacus | SIEMENS | D5000 |